ZMI-2002 8020-0211 ZYGO 高性能双轴测量板 成都阳光熹禾

Description

产品细节说明:ZMI-2002 8020-0211 ZYGO 高性能双轴测量板

该双轴测量板适用于各种精密测量和控制系统，包括光学元件制造、半导体制造、数据存储、精密机械加工和科研等领域。它能够测量表面粗糙度、台阶高度、坡度和其他表面形貌参数，并检测表面缺陷，如划痕、坑洼和颗粒。此外，它还可用于分析表面形貌与光学性能或设备性能之间的关系，以及进行质量控制和工艺改进

• 双轴测量：允许同时测量两个测量轴，适合需要二维测量或控制的应用场景。
• 高精度：通常采用高精度传感器和电路设计，以实现高精度测量和控制。
• 可编程性：支持多种编程语言和协议，便于开发和定制。
• 模块化设计：采用模块化设计，便于扩展和定制，可根据不同的应用需求进行配置和扩展

ZMI-2002 8020-0211

产品详情参数:ZMI-2002 8020-0211 ZYGO 高性能双轴测量板

• 光源：633 nm 激光
• 传感器：CMOS 阵列
• 分辨率：小于 1 纳米 (< 1 nm)
• 测量范围：X 轴 50 毫米 (mm)，Y 轴 25 毫米 (mm)
• 精度：±0.1 微米 (µm)
• 工作温度：0°C 至 +40°C
• 保护等级：IP54
• 尺寸：229 x 114 x 29 毫米 (mm)
• 重量：1.2 公斤 (kg)

ZMI-2002 8020-0211 ZYGO   应用领域:

这款测量板以其高精度测量、双轴同步测量、数字化信号处理、兼容性与扩展性为主要特点，并可能配套有专业的控制软件，使用户可以配置测量参数、实时监控测量结果并进行数据分析 。

Product Details: ZMI-2002 8020-0211 ZYGO High Performance Dual Axis Measurement Board

This dual axis measuring board is suitable for various precision measurement and control systems, including optical component manufacturing, semiconductor manufacturing, data storage, precision machining, and scientific research. It can measure surface roughness, step height, slope, and other surface morphology parameters, and detect surface defects such as scratches, potholes, and particles. In addition, it can also be used to analyze the relationship between surface morphology and optical or equipment performance, as well as for quality control and process improvement

Dual axis measurement: allows simultaneous measurement of two measurement axes, suitable for applications that require two-dimensional measurement or control.
High precision: Typically, high-precision sensors and circuit designs are used to achieve high-precision measurement and control.
Programmable: Supports multiple programming languages and protocols for easy development and customization.
Modular design: Adopting modular design, it is easy to expand and customize, and can be configured and expanded according to different application needs
Product details and parameters: ZMI-2002 8020-0211 ZYGO high-performance biaxial measuring board
Light source: 633 nm laser
Sensor: CMOS array
Resolution: Less than 1 nanometer (<1 nm)
Measurement range: X-axis 50 millimeters (mm), Y-axis 25 millimeters (mm)
Accuracy: ± 0.1 micrometers (µ m)
Working temperature: 0 ° C to+40 ° C
Protection level: IP54
Size: 229 x 114 x 29 millimeters (mm)
Weight: 1.2 kilograms (kg)
ZMI-2002 8020-0211 ZYGO Application Fields:

This measuring board is mainly characterized by its high-precision measurement, dual axis synchronous measurement, digital signal processing, compatibility and scalability, and may be equipped with professional control software, allowing users to configure measurement parameters, monitor measurement results in real time, and perform data analysis.

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